TPG-171p
Test pattern generator
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The TPG-171p Test Pattern Generator provides 10-bit resolution SDI output in 525-line or 625-line formats. An error detection (EDH) signal can be inserted in the ancillary data area and up to 32 test patterns can be generated. An audio tone can also be embedded in the serial digital output. The output can be genlocked to a composite analog reference or left free running. All of the principal controls are accessible on the top of the device. Two AES-3id audio outputs are also provided. A low powered, compact device with the features of a professional signal generator.
- SDI output (270 Mbps) in 525-line (60 Hz) or 625-line (50 Hz) format
- Reference input (NTSC / PAL) to genlock the digital output
- Free running mode when the reference is not present (170M SMPTE ±10 Hz)
- Over 32 test patterns with 10-bit precision
- Single and multiple line patterns to allow complex pattern generation
- One complete group with 20-bit or 24-bit (AES-EBU 1+2) embedded audio tone selectable by a dip switch. Continuous tone for right channels and intermittent for left channels.
- EDH insertion: active picture and full field
- Y, Cb, Cr control
- Fixed Time Code insertion
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